Precise Surface Correction

The scia Trim 200 is used for high precision surface trimming of wafers, without limitations in film and wafer materials. Designed for high-volume production the system has a throughput and maintenance optimized layout with a semiconductor cassette handling robot that accommodates all standard wafer sizes. In addition, a cluster configuration with two process chambers and two cassette load locks is available.

Features & Benefits

  • Significant yield improvement
  • Film thickness homogeneity to be adjusted down to atom level of 0.1 nm
  • No edge exclusion with electrostatic chuck
  • Sub-nanometer removal with zero base etch function
  • Processing of film and wafer materials without restrictions
  • Throughput and maintenance optimized design for low production costs
  • Processing of wafers with photoresist masks due to good wafer cooling

Applications

Results IBT

  • Frequency trimming of bulk acoustic wave (BAW) or surface acoustic wave (SAW) filters
  • Thickness trimming of silicon on insulator (SOI), quartz, lithium tantalate (LT) or lithium niobate (LN) wafers
  • Film thickness error or step height correction in thin film head (TFH) manufacturing
  • Dimensional correction of MEMS structures
  • Form error correction for X-ray mirrors
     

Application Notes

Principle

  • Focused broad ion beam scans across wafer surface in vertical setup for low contamination
  • Local material removal is controlled by adjusting the dwell time
     

Technologies

Ion Beam Trimming (IBT) is where a focused broad ion beam scans across the wafer and the local material removal is controlled by adjusting the dwell time.

Reactive Ion Beam Trimming (RIBT) introduces reactive gas into the ion beam source for reactive structuring of the surface.

Ion Beam Figuring (IBF) is a polishing error correction by a scanning ion beam and dwell time control.

Detailed Information

Technical Data
Process Results

PDF Download

Product Flyer scia Trim 200

 

Reach out

Please contact us for further information.

Product Overview

Download our brochure as PDF.

Other Ion Beam Etching Systems

scia Trim 300

for large area surface correction of wafers up to 300 mm

scia Mill 200

for full surface etching of wafers up to 200 mm

scia Finish 1500

for polishing error correction on
substrates up to 1500 mm